Characterization in silicon processing / editor,Yale Strusser.
Material type:
TextPublication details: Boston : Butterworth-Heinemann;/Grenwich;, 1993. Description: 240p. : ill.; 25cmISBN: - 0750691727
| Item type | Current library | Call number | Status | Date due | Barcode |
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Politeknik Seberang Perai Open Shelf | QC611.8 S5.C48 1993 (Browse shelf(Opens below)) | Available | 0000008791 | |
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Politeknik Seberang Perai Open Shelf | QC611.8 S5.C48 1993 (Browse shelf(Opens below)) | Available | 0000008787 | |
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Book
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Politeknik Seberang Perai Open Shelf | QC611.8 S5.C48 1993 (Browse shelf(Opens below)) | Available | 0000008788 | |
|
Book
|
Politeknik Seberang Perai Open Shelf | QC611.8 S5.C48 1993 (Browse shelf(Opens below)) | Available | 0000008789 | |
|
Book
|
Politeknik Seberang Perai Open Shelf | QC611.8 S5.C48 1993 (Browse shelf(Opens below)) | Available | 0000008790 |
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| QC530.Z23 2009 Prinsip elketrik / | QC530.Z23 2009 Prinsip elketrik / | QC611.8 S5.C48 1993 Characterization in silicon processing / | QC611.8 S5.C48 1993 Characterization in silicon processing / | QC611.8 S5.C48 1993 Characterization in silicon processing / | QC611.8 S5.C48 1993 Characterization in silicon processing / | QC611.8 S5.C48 1993 Characterization in silicon processing / |
Includes index.
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