Characterization in silicon processing / editor,Yale Strusser.
Material type:
TextPublication details: Boston : Butterworth-Heinemann;/Grenwich;, 1993. Description: 240p. : ill.; 25cmISBN: - 0750691727
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Politeknik Seberang Perai Open Shelf | QC611.8 S5.C48 1993 (Browse shelf(Opens below)) | Available | |
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Politeknik Seberang Perai Open Shelf | QC611.8 S5.C48 1993 (Browse shelf(Opens below)) | Available | |
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Politeknik Seberang Perai Open Shelf | QC611.8 S5.C48 1993 (Browse shelf(Opens below)) | Available | |
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Politeknik Seberang Perai Open Shelf | QC611.8 S5.C48 1993 (Browse shelf(Opens below)) | Available | |
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Politeknik Seberang Perai Open Shelf | QC611.8 S5.C48 1993 (Browse shelf(Opens below)) | Available |
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| QC611.8 S5.C48 1993 Characterization in silicon processing / | QC611.8 S5.C48 1993 Characterization in silicon processing / | QC611.8 S5.C48 1993 Characterization in silicon processing / | QC611.8 S5.C48 1993 Characterization in silicon processing / | QC661.D57 1998 Electromagnetic waves / | QC661.K72 1999 Electromagnetics : with applications / | QC661.S778 1994 Electromagnetic waves / |
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